[ sulge aken ]
| Elulookirjeldus (CV) | ||
| 1. | Eesnimi | Margit |
| 2. | Perekonnanimi | Aarna |
| 3. | Töökoht | Tallinna Tehnikaülikooli Arvutitehnika instituut |
| 4. | Ametikoht | teadur |
| 5. | Sünniaeg | 09.10.1973 (päev.kuu.aasta) |
| 6. | Haridus | 2001, Tallinna Tehnikaülikool, tehnikateaduste magister 2000, Tallinna Tehnikaülikool, Arvuti- ja süsteemitehnika õppevaldkond 1992, Tallinna 13. Keskkool |
| 7. | Teenistuskäik | 1.09.2003 - ..., Tallinna Tehnikaülikool, teadur 01.01. - 31.08.2003, Tallinna Tehnikaülikool, insener 2000 - 2003, Tallinna Tehnikaülikool, osalemine teadusprojektides |
| 8. | Teaduskraad | Tehnikateaduste magister |
| 9. | Teaduskraadi välja andnud asutus, aasta |
Tallinna Tehnikaülikool, 2001 |
| 10. | Tunnustused | 2004, Tiigriülikooli stipendium IKT doktorandile 2005, Tiigriülikooli stipendium IKT doktorandile |
| 11. | Teadusorganisatsiooniline ja –administratiivne tegevus |
|
| 12. | Juhendamisel kaitstud väitekirjad |
|
| 13. | Teadustöö põhisuunad | Digitaalsüsteemide rikkesimuleerimisalgoritmid |
| 14. | Jooksvad grandid | 5637, Kõrgtaseme testigenereerimine ja testitavuse analüüs digitaalskeemidele, J. Raik |
| 15. | Teaduspublikatsioonid |
R. Ubar, M.Aarna, H.Kruus, J.Raik. How to Generate High Quality Tests for Digital Systems. IEEE International Semiconductor Conference, CAS’2004, Vol. 2, pp. 459-462, Sinaia, Romania, Oct. 4-6, 2004. R.Ubar, M.Aarna, M.Brik, J.Raik. High-Level Fault Modeling in Digital Systems. Synergies between Information Processing and Automation, International Conference IWK, Shaker Verlag, Vol.2, pp. 486-491, Ilmenau, Germany, September 27-30, 2004. R.Ubar, M.Aarna, M.Brik, T.Evartson, J.Raik. High Level Fault Models for Digital Systems. In "University Research, Industry, International Cooperation", Minsk, 2004 pp.303-310. M.Aarna, E.Ivask, A.Jutman, E.Orasson, J.Raik, R.Ubar, V.Vislogubov, H.D.Wuttke. Turbo Tester - Diagnostic Package for Research and Training. J. of Radioelectronics and Informatics, No3 (24), July - September, 2003, pp. 69-73. M.Aarna, J.Raik, R.Ubar. Parallel Fault Simulation in Digital Circuits, Proc. of 42th International Scientific Conference of Riga Technical University, pp.91-94, Riga, October 11-13, 2001. |
viimati muudetud: 03.08.2005
| Curriculum Vitae (CV) | ||
| 1. | First Name | Margit |
| 2. | Surname | Aarna |
| 3. | Institution | Tallinn University of Technology, Department of Computer Engineering |
| 4. | Position | researcher |
| 5. | Date of birth | 09.10.1973 (day.month.year) |
| 6. | Education | 2001, Tallinn University of Technology, MSc 2000, Tallinn University of Technology, Diploma of Computer and Systems Engineering 1992, Tallinn Secondary School No. 13 |
| 7. | Research and professional experience |
1.09.2003 - ... - Tallinn University of Technology - researcher 01.01. - 31.08.2003 - Tallinn University of Technology - engineer 2000 – 2003 - Tallinn University of Technology - scientific projects at TUT |
| 8. | Academic degree | Master of Science |
| 9. | Dates and sites of earning the degrees |
Tallinn University of Technology, 2001 |
| 10. | Honours/awards | 2004, EITSA Scholarship for PhD students in ICT field 2005, EITSA Scholarship for PhD students in ICT field |
| 11. | Research-administrative experience |
|
| 12. | Supervised dissertations | |
| 13. | Current research program | Fault simulation methods for digital systems |
| 14. | Current grant funding | 5637, High-Level Test Generation and Testability Analysis for Digital Circuits, J. Raik |
| 15. | List of most important publications |
R. Ubar, M.Aarna, H.Kruus, J.Raik. How to Generate High Quality Tests for Digital Systems. IEEE International Semiconductor Conference, CAS’2004, Vol. 2, pp. 459-462, Sinaia, Romania, Oct. 4-6, 2004. R.Ubar, M.Aarna, M.Brik, J.Raik. High-Level Fault Modeling in Digital Systems. Synergies between Information Processing and Automation, International Conference IWK, Shaker Verlag, Vol.2, pp. 486-491, Ilmenau, Germany, September 27-30, 2004. R.Ubar, M.Aarna, M.Brik, T.Evartson, J.Raik. High Level Fault Models for Digital Systems. In "University Research, Industry, International Cooperation", Minsk, 2004 pp.303-310. M.Aarna, E.Ivask, A.Jutman, E.Orasson, J.Raik, R.Ubar, V.Vislogubov, H.D.Wuttke. Turbo Tester - Diagnostic Package for Research and Training. J. of Radioelectronics and Informatics, No3 (24), July - September, 2003, pp. 69-73. M.Aarna, J.Raik, R.Ubar. Parallel Fault Simulation in Digital Circuits, Proc. of 42th International Scientific Conference of Riga Technical University, pp.91-94, Riga, October 11-13, 2001. |
last updated: 03.08.2005
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