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Elulookirjeldus (CV)
1.Eesnimi Peep
2.Perekonnanimi Adamson
3.Töökoht TÜ Füüsika Instituut
4.Ametikoht Vanemteadur
5.Sünniaeg 19.12.1949 (päev.kuu.aasta)
6.Haridus Tartu Ülikool, 1973, teoreetiline füüsika
7.Teenistuskäik 1990- vanemteadur FI-s
1986-1990 teadur FI-s
1975-1986 insener, nooremteadur FI-s
8.Teaduskraad Füüsika-matemaatikakandidaat
9.Teaduskraadi välja
andnud asutus, aasta		 Eesti TA Füüsika Instituut, 1988
10.Tunnustused
11.Teadusorganisatsiooniline
ja –administratiivne
tegevus
12.Juhendamisel kaitstud
väitekirjad
13.Teadustöö põhisuunad Nano- ja mikro-optika, elektromagnetiliste lainete teooria, füüsikaline optika ja optiline diagnostika
14.Jooksvad grandid
15.Teaduspublikatsioonid

Adamson, P. (2005). Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films, In Proc. SPIE 5946, pp. 336-345.

Adamson, P. (2005). Differential reflection characteristics for optical probing of nanoscale anisotropic layered system, In 2005 International Conference on MEMS, NANO and Smart Systems, W. Badaway, W. Moussa, eds., pp. 307–313, IEEE Comput. Soc., USA.

Adamson, P. (2005). Long-wavelength approximation theory of light reflection from nanoscale anisotropic layered media. In Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, vol. 3, pp. 664-667, ISBN 0-9767985-2-2, NSTI, Boston, USA.

Adamson, P. (2005). Reflection characteristics of nanoscopic anisotropic layered structures and optical diagnostics of nanofilms, In 2005 Fifth IEEE Conference on Nanotechnology, pp. 409–412, ISBN 0-7803-9199-3, IEEE, Piscataway, NJ, USA.

Adamson, P. (2005). Reflection of light in the vicinity of the Brewster angle from a multilayer system of ultrathin inhomogeneous dielectric films. Journal of Modern Optics, 52(10), 1457-1469.

Adamson, P. (2005). Scanning angle differential reflectometry around the Brewster angle to probe ultrathin dielectric films. Thin Solid Films, 492, 221–225.

Adamson, P. (2004). High-aperture focusing systems: control of light concentration in focal region by pupil filtering. Journal of Modern Optics, 51(1), 65-74.

Adamson, P. (2004). Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry. Optics and Laser Technology, 36(8), 661-668.

Adamson, P. (2004). Optical probing of nanoscopic insulating layered structures via differential characteristics of specular reflection of light, In 2004 International Conference on MEMS, NANO and Smart Systems, W. Badaway, W. Moussa, eds., pp. 535–541, ISBN 0-7695-2189-4, IEEE, Piscataway, NJ, USA.

Adamson, P. (2004). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. II. Transparent substrate. Journal of the Optical Society of America B-Optical Physics, 21(3), 645-654

Adamson, P. (2003). Numerical analysis of transverse localization of radiation in freely propagating electromagnetic Bessel beams, In Mathematical and Numerical Aspects of Wave Propagation, G. C. Cohen, E. Heikkola, P. Joly, P. Neittaanmäki, eds., pp. 304-308, ISBN 354040127X, Springer-Verlag.

Adamson, P. (2003). Optical diagnostics of nanometer dielectric films by combining ellipsometry and differential reflectance, In Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes to Nanomeeting 2003, V. E. Borisenko, S. V. Gaponenko, V. S. Gurin, eds., pp. 96–99, ISBN 9-8123-8381-6, World Scientific, Singapore.

Adamson, P. (2003). Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films, In 2003 Third IEEE Conference on Nanotechnology, vol. 2, pp. 836–839, ISBN 0-7803-7976-4, IEEE, Piscataway, NJ, USA.

Adamson, P. (2003). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. I. Absorbing substrate. Journal of the Optical Society of America B-Optical Physics, 20(4), 752-759.

Adamson, P. (2002). Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry. Optics and Laser Technology, 34(7), 561-568.

Adamson, P. (2001). Diagnostics of ultrathin dielectric layers by the method of differential reflection of light. In Proc. SPIE 4415, pp. 202-207.

Adamson, P. (2001). Photoreflectance diagnostics of nanometer dielectric films, In Physics, Chemistry and Applications of Nanostructures: Reviews and Short Notes to Nanomeeting 2001, V. E.Borisenko, S.V.Gaponenko, V.S.Gurin, eds., pp. 206-209, ISBN 9810246188, World Scientific, Singapore.

Adamson, P. (2001). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials (Vol 89, pg 624, 2000). Optics and Spectroscopy, 90(6), 943-943.

Adamson, P. (2000). Antireflecting surface coatings with continuously varying complex refractive index. Technical Physics Letters, 26(11), 1003-1006.

Adamson, P. (2000). Comparison of the high-aperture Bessel and Gaussian beams. Optics and Spectroscopy, 88(2), 242-245.

Adamson, P. (2000). Focused Bessel beams. Quantum Electronics, 30(4), 365-369.

Adamson, P. (2000). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials. Optics and Spectroscopy, 89(4), 624-630.

Adamson, P. (1999). Differential Reflection Photometry of Ultrathin Dielectric Layers on Strongly Absorbing Materials. Optics and Spectroscopy, 86(3), 408-414.

Rosental, A., Tarre, A., Adamson, P., Gerst, A., Kasikov, A., & Niilisk, A. (1999). Surface of Tio2 During Atomic Layer Deposition as Determined by Incremental Dielectric Reflection. Applied Surface Science, 142(1-4), 204-209.

Adamson, P. (1998). Effect of Diffraction of Light on the Signal-to-Noise Ratio in Thin-Film Optical Memory Based on Spectral Hole Burning. Optics and Spectroscopy, 84(2), 286-293.

Adamson, P. (1998). Monitoring the Deposition of an Interference Film by Differential Reflection of Light. Technical Physics Letters, 24(10), 822-825.

Adamson, P. (1998). Storage Density and Signal/Noise Ratio in a Binary Frequency- Selective Optical Memory Utilising Multistage Optical Spectral Hole Burning. Quantum Electronics, 28(9), 806-811.

Adamson, P. (1997). Interference Enhancement of the Sensitivity and the Signal-to- Noise Ratio in Differential Spectrodensitometry of Surface Layers With Normally Reflected Light. Optics and Spectroscopy, 82(3), 403-409.

Rosental, A., Adamson, P., Gerst, A., Koppel, H., & Tarre, A. (1997). Atomic Layer Deposition in Traveling-Wave Reactor: in Situ Diagnostics by Optical Reflection. Applied Surface Science, 112, 82-86.

Rosental, A., Tarre, A., Gerst, A., Adamson, P., Sammelselg, V., & Uustare, T. (1997). Atomic-layer-deposited TiO2 dielectric coatings. In Proc. SPIE, 2967, pp. 245-250.

Adamson, P. (1996). Differential Reflection Spectroscopy of Surface Layers on Thick Transparent Substrates with Normally Incident Light. Optics and Spectroscopy, 80(3), 459-468.

Adamson, P. (1996). New Photometric Method for Optical Diagnostics of Surface Layers of Transparent Materials. Technical Physics Letters, 22(10), 837-839.

viimati muudetud: 10.10.2005

Curriculum Vitae (CV)
1.First Name Peep
2.Surname Adamson
3.Institution Institute of Physics, University of Tartu
4.Position Senior researcher
5.Date of birth 19.12.1949 (day.month.year)
6.Education University of Tartu, 1973, theoretical physics
7.Research and
professional experience		 1990- senior researcher, Institute of Physics, University of Tartu
1986-1990 researcher, Institute of Physics, Estonian Acad. Sci.
1975-1986 engineer, Institute of Physics, Estonian Acad. Sci.
8.Academic degree Candidate of sciences (Ph.D)
9.Dates and sites of
earning the degrees		 Institute of Physics, Estonian Academy of Sciences, 1988
10.Honours/awards
11.Research-administrative
experience
12.Supervised dissertations
13.Current research program Nano- and micro-optics, theory of electromagnetic waves, physical optics and optical diagnostics
14.Current grant funding
15.List of most important publications

Adamson, P. (2005). Characteristic reflection angles of nanoscopic layered media and optical probing of ultrathin dielectric films, In Proc. SPIE 5946, pp. 336-345.

Adamson, P. (2005). Differential reflection characteristics for optical probing of nanoscale anisotropic layered system, In 2005 International Conference on MEMS, NANO and Smart Systems, W. Badaway, W. Moussa, eds., pp. 307–313, IEEE Comput. Soc., USA.

Adamson, P. (2005). Long-wavelength approximation theory of light reflection from nanoscale anisotropic layered media. In Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, vol. 3, pp. 664-667, ISBN 0-9767985-2-2, NSTI, Boston, USA.

Adamson, P. (2005). Reflection characteristics of nanoscopic anisotropic layered structures and optical diagnostics of nanofilms, In 2005 Fifth IEEE Conference on Nanotechnology, pp. 409–412, ISBN 0-7803-9199-3, IEEE, Piscataway, NJ, USA.

Adamson, P. (2005). Reflection of light in the vicinity of the Brewster angle from a multilayer system of ultrathin inhomogeneous dielectric films. Journal of Modern Optics, 52(10), 1457-1469.

Adamson, P. (2005). Scanning angle differential reflectometry around the Brewster angle to probe ultrathin dielectric films. Thin Solid Films, 492, 221–225.

Adamson, P. (2004). High-aperture focusing systems: control of light concentration in focal region by pupil filtering. Journal of Modern Optics, 51(1), 65-74.

Adamson, P. (2004). Laser diagnostics of nanoscale dielectric films on transparent substrate by integrating differential reflectivity and ellipsometry. Optics and Laser Technology, 36(8), 661-668.

Adamson, P. (2004). Optical probing of nanoscopic insulating layered structures via differential characteristics of specular reflection of light, In 2004 International Conference on MEMS, NANO and Smart Systems, W. Badaway, W. Moussa, eds., pp. 535–541, ISBN 0-7695-2189-4, IEEE, Piscataway, NJ, USA.

Adamson, P. (2004). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. II. Transparent substrate. Journal of the Optical Society of America B-Optical Physics, 21(3), 645-654

Adamson, P. (2003). Numerical analysis of transverse localization of radiation in freely propagating electromagnetic Bessel beams, In Mathematical and Numerical Aspects of Wave Propagation, G. C. Cohen, E. Heikkola, P. Joly, P. Neittaanmäki, eds., pp. 304-308, ISBN 354040127X, Springer-Verlag.

Adamson, P. (2003). Optical diagnostics of nanometer dielectric films by combining ellipsometry and differential reflectance, In Physics, Chemistry and Application of Nanostructures: Reviews and Short Notes to Nanomeeting 2003, V. E. Borisenko, S. V. Gaponenko, V. S. Gurin, eds., pp. 96–99, ISBN 9-8123-8381-6, World Scientific, Singapore.

Adamson, P. (2003). Reflection characteristics of nanoscopic layered structures and optical diagnostics of ultrathin dielectric films, In 2003 Third IEEE Conference on Nanotechnology, vol. 2, pp. 836–839, ISBN 0-7803-7976-4, IEEE, Piscataway, NJ, USA.

Adamson, P. (2003). Reflection of light in a long-wavelength approximation from an N-layer system of inhomogeneous dielectric films and optical diagnostics of ultrathin layers. I. Absorbing substrate. Journal of the Optical Society of America B-Optical Physics, 20(4), 752-759.

Adamson, P. (2002). Laser diagnostics of nanoscale dielectric films on absorbing substrate by differential reflectivity and ellipsometry. Optics and Laser Technology, 34(7), 561-568.

Adamson, P. (2001). Diagnostics of ultrathin dielectric layers by the method of differential reflection of light. In Proc. SPIE 4415, pp. 202-207.

Adamson, P. (2001). Photoreflectance diagnostics of nanometer dielectric films, In Physics, Chemistry and Applications of Nanostructures: Reviews and Short Notes to Nanomeeting 2001, V. E.Borisenko, S.V.Gaponenko, V.S.Gurin, eds., pp. 206-209, ISBN 9810246188, World Scientific, Singapore.

Adamson, P. (2001). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials (Vol 89, pg 624, 2000). Optics and Spectroscopy, 90(6), 943-943.

Adamson, P. (2000). Antireflecting surface coatings with continuously varying complex refractive index. Technical Physics Letters, 26(11), 1003-1006.

Adamson, P. (2000). Comparison of the high-aperture Bessel and Gaussian beams. Optics and Spectroscopy, 88(2), 242-245.

Adamson, P. (2000). Focused Bessel beams. Quantum Electronics, 30(4), 365-369.

Adamson, P. (2000). The influence of a multilayer system of inhomogeneous ultrathin films on reflection of light from dielectric materials. Optics and Spectroscopy, 89(4), 624-630.

Adamson, P. (1999). Differential Reflection Photometry of Ultrathin Dielectric Layers on Strongly Absorbing Materials. Optics and Spectroscopy, 86(3), 408-414.

Rosental, A., Tarre, A., Adamson, P., Gerst, A., Kasikov, A., & Niilisk, A. (1999). Surface of Tio2 During Atomic Layer Deposition as Determined by Incremental Dielectric Reflection. Applied Surface Science, 142(1-4), 204-209.

Adamson, P. (1998). Effect of Diffraction of Light on the Signal-to-Noise Ratio in Thin-Film Optical Memory Based on Spectral Hole Burning. Optics and Spectroscopy, 84(2), 286-293.

Adamson, P. (1998). Monitoring the Deposition of an Interference Film by Differential Reflection of Light. Technical Physics Letters, 24(10), 822-825.

Adamson, P. (1998). Storage Density and Signal/Noise Ratio in a Binary Frequency- Selective Optical Memory Utilising Multistage Optical Spectral Hole Burning. Quantum Electronics, 28(9), 806-811.

Adamson, P. (1997). Interference Enhancement of the Sensitivity and the Signal-to- Noise Ratio in Differential Spectrodensitometry of Surface Layers With Normally Reflected Light. Optics and Spectroscopy, 82(3), 403-409.

Rosental, A., Adamson, P., Gerst, A., Koppel, H., & Tarre, A. (1997). Atomic Layer Deposition in Traveling-Wave Reactor: in Situ Diagnostics by Optical Reflection. Applied Surface Science, 112, 82-86.

Rosental, A., Tarre, A., Gerst, A., Adamson, P., Sammelselg, V., & Uustare, T. (1997). Atomic-layer-deposited TiO2 dielectric coatings. In Proc. SPIE, 2967, pp. 245-250.

Adamson, P. (1996). Differential Reflection Spectroscopy of Surface Layers on Thick Transparent Substrates with Normally Incident Light. Optics and Spectroscopy, 80(3), 459-468.

Adamson, P. (1996). New Photometric Method for Optical Diagnostics of Surface Layers of Transparent Materials. Technical Physics Letters, 22(10), 837-839.

last updated: 10.10.2005

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