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The progress in the materials science has brought about demands for new sensitive methods for characterization of processes in nanoscale. The possible solutions are complicated because of the dynamism of the processes. The aim of the current project is to investigate the physical background of nanointeractions and apply different methods to describe these processes in order to create a cognitive knowledge-based system. Innovative equipment for the investigations is planned to be elaborated in order to unite the best features of the different research methods. E.g. in collaboration with Latvian and Swedish colleagues, our group invented a novel “microscope-inside-microscope” device that enables to visualize Scanning Probe Microscope processes inside the Transmission Electron Microscope. This tool allows to investigate in situ processes, such as atoms jumps between two tips, to measure different forces and follow nanowire creation. The improvements to the present methodology are planned by adding a quartz resonator to the system as a vibrational component. The elaborated unit is planned for nanocontact formation investigations in high frequency conditions. Process dynamics is planned to be followed also under the conditions of mechanical influencing of a sample. Besides electron microscope visualizations, several perturbations (temperature and optical pulses) are applied simultaneously. One of the research subjects involves the investigations of the properties of a unique optically transparent and electrically conductive fiber (elaborated at the Institute of Physics, University of Tartu) under different influences. Several spectroscopic methods are planned to be exploited for the studies of sensormaterials optical properties. The terahertz wavelength scale excitation is engaged to identify the internal properties of the material by using boron nitride nanorod bunches. Although this project holds a rather big risk factor, the method promises innovative results on the detection of the material’s internal defects. This topic is extremely important for industries as it allows to monitor material fatigue and micro- and nanocracks formation. Also, Atomic Force Microscope is applied in the investigations of nanocrack formation. The same technique is in use for the investigation of the properties of TiO2 ultra thin films (created by atomic layer epitaxy) under various impact factors. Some parts of the project are included in the European Science Foundation project “Nanotribology” involving the partners’ competence through a network to the present project. |