title: Nanometric in-situ characterisation of novel technological materials and thin film structures
reg no: ETF6651
project type: Estonian Science Foundation research grant
subject: 1.3. Physics
1.6. Physical, Analytical and Inorganic Chemistry
2.2. Materials Science
status: accepted
institution: Institute of Physics at University of Tartu
head of project: Väino Sammelselg
duration: 01.01.2006 - 31.12.2009
description: The project focuses on the research of the various novel materials and thin films in the prospectively technologically interesting thin film structures, and on composing the materials and thin film structures. Local probe methods of thin film characterisation will be used.
The main emphasis is set on the development of reliable robust in-situ methods for characterisation of thin and ultrathin films and application of these methods for investigation of initial growth stages of the metal oxide films produced by the atomic layer deposition method, as well as of the electrochemically deposited polymer films, and of the hybrid films produced by combining the former two deposition methods. The feasibility of utilising the produced thin film structures in nanoelectronic devices, specific sensors, coating films and other applications will be assessed. The project is based on insulating and conducting metal oxide films and conductive polypyrrole films while remaining open to the inclusion of components of other material classes if necessary.

project group
no name institution position  
1.Aleks Aidla 
2.Ants Alumaa 
3.Allan Hallik 
4.Tanel Käämbre 
5.Marina Lulla 
6.Margus Marandi 
7.Raul Rammula 
8.Toonika Rinken 
9.Väino SammelselgTartu Ülikooli Füüsika Instituut 
10.Teet Uustare